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ATSUGI, Japan Oct. 5, 2009 -- Anritsu presents the measurement solutions available for Long Term
Evolution (LTE), the next generation of mobile communication services, at CEATEC JAPAN 2009 to be held at Makuhari Messe (Chiba-city, Chiba Prefecture) from 6 - 10 October.
LTE is the next-generation mobile communication service planned to be introduced in 2010, by telecom carriers in Japan, Europe and the United States. Since LTE is an IP-based wireless technology, its application is expected to spread, from mobile phones to wide range of fields such as personal computers, car electronics and digital home appliances.
Anritsu supports the development of various communication services through the provision of measuring instruments ranging from product development, manufacturing to maintenance. In the field of LTE, too, Anritsu provides various types of LTE-compliant measurement devices through participation in formulation of the international standards together with telecommunication carriers and handset manufacturers from around the world.
A test system combining MD8430A Signalling Tester and MF6900A Fading Simulator enables the creation of a virtual LTE network that allows fading tests, throughput tests for 100 Mbps downlink and that for 50 Mbps uplink in a 2×2 MIMO environment as required by LTE standards. We would also display transmission and reception evaluation tests for LTE terminals, base stations and chipsets using MS269xA-series signal analyzers and MG3700A vector signal generators.
Anritsu will introduce LTE measurement solutions realized by the latest technologies and partnerships with global customers at the Anritsu Booth.
Information Source: Business Wire
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